An international consortium including the Łukasiewicz Institute of Electronic Materials Technology (ITME) has begun work on the “Modeling Unconventional Nanoscaled Device FABrication” project.

The main task of ITME will be to perform and interpret measurements using secondary ion mass spectrometry (SIMS) and to integrate the results with other complementary measurement techniques.

The consortium, whose leader is the German Fraunhofer Institute for Integrated Systems and Device Technology, has decided that SIMS tests will be performed only at ITME due to the high quality of the equipment at the Institute’s disposal.
Research will be financed under the Unconventional Nanoelectronic Horizon 2020 program.